| 翻訳と辞書 |
| Field ion microscope ： ウィキペディア英語版 |
Field ion microscope
Field ion microscopy (FIM) is an analytical technique used in materials science. The field ion microscope is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip. It was the first technique by which individual atoms could be spatially resolved.
On October 11, 1955, Müller and Kanwar Bahadur (Pennsylvania State University) observed individual tungsten (W) atoms on the surface of a sharply pointed W tip by cooling it to 78 K and employing helium as the imaging gas. Müller & Bahadur were the first persons to observe individual atoms directly; to do so, they used an FIM, which Müller had invented in 1951.
==Introduction==
In FIM, a sharp (<50 nm tip radius) metal tip is produced and placed in an ultra high vacuum chamber, which is backfilled with an imaging gas such as helium or neon. The tip is cooled to cryogenic temperatures (20–100 K). A positive voltage of 5 to 10 kilovolts is applied to the tip. Gas atoms adsorbed on the tip are ionized by the strong electric field in the vicinity of the tip (thus, "field ionization"), becoming positively charged and being repelled from the tip. The curvature of the surface near the tip causes a natural magnification — ions are repelled in a direction roughly perpendicular to the surface (a "point projection" effect). A detector is placed so as to collect these repelled ions; the image formed from all the collected ions can be of sufficient resolution to image individual atoms on the tip surface.
Unlike conventional microscopes, where the spatial resolution is limited by the wavelength of the particles which are used for imaging, the FIM is a projection type microscope with atomic resolution and an approximate magnification of a few million times.
抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』
■ウィキペディアで「Field ion microscope」の詳細全文を読む
スポンサード リンク
| 翻訳と辞書 : 翻訳のためのインターネットリソース |
Copyright(C) kotoba.ne.jp 1997-2016. All Rights Reserved.
|
|